SAE Offers Test Seminars

February 29th, 2008

Accelerated Test Methods for Ground and Aerospace Vehicle Development Seminar
When: April 17-18, 2008
Where: Detroit, Michigan, USA
Instructor: Alexander (Alex) J. Porter
Engineers and managers involved with product development are constantly challenged to reduce time to market, minimize warranty costs, and increase product quality. With less and less time for testing, the need for effective accelerated test procedures has never been greater. This course covers the benefits, limitations, processes, and applications of several proven accelerated test methods including accelerated reliability, step stress, FSLT (Full System Life Test), FMVT(R) (Failure Mode Verification Testing), HALT (Highly Accelerated Life Testing), and HASS (Highly Accelerated Stress Screening). A combination of hands-on exercises, team activities, discussion, and lecture are used throughout the course.
Registration information: I.D.# C0316; Fees: $1,185; SAE Members: $1,065; 1.3 CEUs

Practical NVH Signal Processing Methods Seminar
When: March 6-7, 2008
Where: Troy, Michigan, USA
Instructor: Michael F. Albright
This seminar covers the foundation common to all NVH data acquisition equipment (including digitizing, windows,
aliasing, and averaging techniques), as well as common analysis functions such as the power spectrum, transfer
function, and coherence.
Registration information: I.D.# C0431; Fees: $1,115; SAE Members: $995; 1.3 CEUs
link

Fundamentals of Metal Fatigue Analysis Seminar
When: April 16-18, 2008
Where: Detroit, Michigan, USA
Instructor: Jess J. Comer
The overall objective of the course is for participants to gain an understanding of the phenomenon of metal fatigue and, most importantly, learn what methods are available to predict and prevent failures.
Registration information: I.D.# 94024; Fees: $1,395; SAE Members: $1,265; 1.8 CEUs
link

Entry Filed under: Everything Else