
October 16th, 2005
The Society of Automotive Engineers (SAE International) and ZVEI–the German Electrical and Electronic Manufacturers’ Association–recently agreed to jointly develop a new qualification standard for semiconductors.
When finalized, the “Robustness Validation” standard should help users discover the physical limits of semiconductors used in automotive applications and will form the basis of risk analysis. In addition to determining a product’s true robustness, the validation methods may allow engineers to determine acceleration factors, as well as address shortcomings in the design and/or manufacturing of the device. Experts believe this standard will increase automotive electronic systems’ quality levels and reliability; the result could be reduced warranty costs.
As an initial step toward collaboration on this standard, a Memorandum of Understanding between SAE International and ZVEI recently was signed.
As similar standard is currently published and promoted by the Automotive Electronics Council (AEC). The standard, AEC - Q100 Rev - F.2: Stress Qualification For Integrated Circuits is widely used by auto industry users and their suppliers.
Robert Knoell of Visteon, an AEC Sustaining Technical Committee Member, noted that they AEC is working with the SAE/ZVEI group. He said, “We have, however, made no commitment to change AEC-Q100 to adhere to whatever we do come up with.”
You must be logged in to post a comment.
AutoTestNews.Com is proudly powered by
WordPress Themes by Isnaini Dot Com
Entries (RSS) .
Comments (RSS) |
Valid: XHTML
. css
. rss2 | Admin: login