PXI System Features Fast Digital Test

September 3rd, 2007

The Rohde and Schwartz TS-PHDT high-speed digital test module for the PXI-based R and S CompactTSVP production test platform enables fast digital functional testing even in applications where large amounts of data have to be handled. The new option features a maximum data rate of 40MHz and a storage capacity of 1.5Gbyte.

All stimulus, nominal and actual data required for testing electronic assemblies is stored locally. Due to the real-time comparison of actual and nominal data, the recorded test data no longer has to be transferred to the system controller, considerably reducing test time.

Rohde and Schwarz developed the compact R and S TS PHDT test module in close cooperation with the RF and Automotive Business Unit of Atmel. The new option was designed for the higher requirements in digital functional testing that are due to the trend toward using ever more complex digital circuits on electronic assemblies.

During the initialization of a functional test, the stimulus data and the nominal data of the DUT is transferred in a single step to the local 1.5 Gbyte memory (3 x 64 Msamples) of the test module. Afterwards, all test cases are immediately available without any further time for loading being required. The integrated analysis hardware compares nominal data with recorded actual data in real time and documents the deviations.

The pass/fail information provides an immediate overview of erroneous test steps and indicates, for example, the number of errors or the failed channels without transferring the test data to the system controller. In addition, the module enables users to program nonvolatile memories in microcontrollers and flash components as well as simulating digital control or processor buses.

The module takes up only one slot of the R and S CompactTSVP platform. Operation is via a soft panel and a driver in dll format. The module is controlled via the PCI bus of the test platform.

The PXI trigger functionality makes it possible to synchronize the module with further R and S TS-PHDT modules as well as with other Rohde and Schwarz or PXI-based measurement and stimulus modules.

Entry Filed under: Automatic Test Equipment