On-Chip Test Interface and Compression Standard Approved

October 19th, 2006

Accellera, the electronics industry organization focused on electronic design automation standards, announced today that its members and Board of Directors have approved a new test standard — the Open Compression Interface standard (OCI 1.0), and its transfer to the IEEE for standardization.

OCI standardizes the interface between different suppliers’ tools to enable vendor interoperability for test pattern generation and diagnosis.

“The goal to improve design productivity with open and interoperability standards led our members and constituents to review how to improve access to test compression data,” said Shrenik Mehta, chair of Accellera. “OCI is a result of these efforts and allows designers to select the best tools for their applications.”

Next Steps
The next step for OCI will be an IEEE ballot for it to become an extension to the IEEE 1450.6 standard. The IEEE 1450.x family of standards is for STIL, a standard tester interface language. OCI leverages IEEE 1450.6, which is the latest extension to STIL called CTL and which allows STIL to support core-based design testing.

The standard is available on the Accelera website.

Entry Filed under: Standards