IEEE Approves ATML Standards

March 3rd, 2008

The IEEE has approved two new standards describing Automatic Test Markup Language (ATML) for exchanging automatic test information via XML (eXtensible Markup Language).

The first new standard, IEEE 1671.3, Trial-Use Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging UUT (Unit Under Test) Description Information,” specifies an exchange format, utilizing XML, for identifying all of the hardware, software and documentation associated with a Unit-Under-Test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS). The standard will help to promote and facilitate interoperability between components of test and maintenance support systems by defining a common set of identification information for UUTs.

The second new standard, IEEE 1671.4, Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Configuration Information, defines an exchange format, utilizing XML, for identifying all of the hardware, software and documentation that may be used to test and diagnose a Unit Under Test (UUT) on an Automatic Test System (ATS). Test Configuration provides a framework, which enables test program set data to be exchanged between compliant systems. The data supports the acquisition and itemization of test assets required to be in place prior to testing a UUT on the test system.

For an in-depth examination of ATML, see ATML: The Standard for Interfacing Test System Components Using XML.

Entry Filed under: Automatic Test Equipment, Test Software