The IEEE has approved two new standards describing Automatic Test Markup Language (ATML) for exchanging automatic test information via XML (eXtensible Markup Language).
The first new standard, IEEE 1671.3, Trial-Use Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging UUT (Unit Under Test) Description Information,” specifies an exchange format, utilizing […]

National Instruments LabVIEW 8.5 Control Design and Simulation Module, an extension of the LabVIEW graphical system design platform, now has design features such as analytical proportional integral derivative (PID) for improving system closed-loop stability and model predictive control to multivariable systems. The LabVIEW Control Design and Simulation Module also offers expanded support of LabVIEW MathScript […]

Available for immediate download, this 200-page (5.0 Mbyte PDF file), full-color technical guidebook provides an overview on building test systems, including a strong emphasis on LXI. Topics include an introduction to test-system design, selection of software and hardware architecture, how to maximize system throughput, and exploring the range of networking options available for test system […]

JTAG Technologies has just released a new version of JTAG ProVision”. Developers will now be able to evaluate their designs for boundary-scan test coverage within the ProVision environment. Precise quantitative results for testability — both theoretical coverage and the actual achieved level — are presented on a net-basis and pin-basis. The theoretical or maximum attainable […]

VI Technology, Inc. recently announced Arendar 2007, its enterprise-level test data management software package. New features include a drag-and-drop report designer with one-click Web publishing of interactive reports, a fully user-customizable Web Dashboard, secure data transfers through firewalls, and interactive data mining of swept parametric data.
Arendar 2007 also comes with a new application programming […]

These all arrived in my inbox this morning, so it seemed like a good opportunity to revive this blog…….Dan
Mentor Graphics, Agilent Partner on Auto Net Design and Test Tools
Mentor Graphics will license certain products in the Mentor Graphics Volcano product line to Agilent Technologies. The Agilent LIN Tester, derived from Mentor’s Volcano LIN Spector product, […]

VEE Pro 8.0 and VEE Express 8.0 help engineers analyze measurement data with task-oriented building blocks, enabling them to focus on connecting instruments, measuring their device, analyzing the data and presenting their results. Other key benefits and features of these updates to VEE are provided by three key capabilities:
Watch Window offers powerful and flexible debugging […]

iHawk(TM) VME is a commercial platform for mission-critical simulation, data acquisition, industrial and aerospace applications. Each iHawk includes the RedHawk Linux real-time operating system. Compatible with the popular Red Hat(R) Linux distribution, RedHawk features high I/O throughput, fast response to external events and optimized interprocess communication. RedHawk is the ideal Linux environment for complex real-time […]

National Instruments recently released a new version of DIAdem, version 10.1, the interactive software for inspecting, analyzing and reporting test data. These include enhancements to the DIAdem DataFinder, a data mining feature that lets engineers perform Internet-like searches across their data files, regardless of format. Engineers can perform advanced searches based on key descriptive information […]

Keithley’s two-day course, “Optimizing Remote Control of Instruments in a LabVIEW Environment,” will teach attendees how to assemble and configure instruments from a variety of vendors into an efficient test setup and control all of them from a single software interface. They will also learn how to avoid costly delays by learning how to recognize […]