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Wind River Test Management, the company’s test automation system for monitoring, executing and managing embedded device software testing, features dynamic analytics technology that enables run-time visibility into devices during testing to provide operational and actionable feedback that product teams can use to confidently deliver their products on time, on budget and with high quality. Wind River Test . . . → Read More: Wind River Test Management Provides Run-Time Insight The latest version of the Elektrobit tresos Inspector now sports a completely redeveloped graphics user interface. Plus, the EB tresos Inspector 2009. In addition, it supports measurement and analysis of both, LIN networks and AUTOSAR PDUs (Protocol Data Units). The new user interface now provides several analysis windows, which can be individually adapted by drag and drop. . . . → Read More: Sofware acquires and analyzes FlexRay, CAN, LIN networks and A/D data simultaneously The IEEE has approved two new standards describing Automatic Test Markup Language (ATML) for exchanging automatic test information via XML (eXtensible Markup Language). The first new standard, IEEE 1671.3, Trial-Use Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging UUT (Unit Under Test) Description Information,” specifies an exchange format, utilizing XML, . . . → Read More: IEEE Approves ATML Standards National Instruments LabVIEW 8.5 Control Design and Simulation Module, an extension of the LabVIEW graphical system design platform, now has design features such as analytical proportional integral derivative (PID) for improving system closed-loop stability and model predictive control to multivariable systems. The LabVIEW Control Design and Simulation Module also offers expanded support of LabVIEW MathScript with . . . → Read More: LabVIEW 8.5 Adds Analytical PID and Model Predictive Control Available for immediate download, this 200-page (5.0 Mbyte PDF file), full-color technical guidebook provides an overview on building test systems, including a strong emphasis on LXI. Topics include an introduction to test-system design, selection of software and hardware architecture, how to maximize system throughput, and exploring the range of networking options available for test system automation. . . . → Read More: Agilent Publishes Handbook for Test Engineers |
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