Archive for the 'Test Equipment' Category
App Notes Explain DMM Use
Monday, August 3rd, 2009Agilent has published three new DMM application notes that you may find useful:
On Improving Digital Multimeter Throughput
This application note describeson how to make a modern digital multimeter operate at its absolute fastest transaction speed. It includes tips on reducing range and function changes, proper auto-zero operation, selecting optimal integration times and using best data […]
Posted in Data Acquisition, Test Equipment | No Comments »
Leak Detectors Communicate
Tuesday, July 7th, 2009The InterTech M-1075-Y Mass Flow Leak Detectors have improved communications capabilities that allow you to integrate leak testing into test-intensive assembly operations. The features of the new instruments include:
Touch screen with simple and intuitive menu-driven operator controls.
Embedded web pages allowing managers to monitor and access operations remotely, including interactive test parameter updates.
Real-time display of […]
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Global NDT Market to Reach $1.2 Billion by 2015
Thursday, June 25th, 2009According to a new report by Global Industry Analysts the non-destructive test (NDT) equipment market will reach $1.2 billion by 2015. Stringent industry product specifications and tight quality control requirements set by the manufacturers are two of the biggest factors driving this demand.
The global market for surface inspection equipment is growing steadily with European […]
Posted in Business News, Test Equipment | No Comments »
ESS Tutorial, Spectrum Analyzer Glossary
Friday, December 12th, 2008Here are two good links from the Electronics Testing & Measurement Bulletin, an e-mail newsletter I receive:
Environmental Stress Screening 101: Free Tutorial
Spectrum Analyzers 101: A Glossary of Testing Terms
Posted in Environmental/Durability Test, Test Equipment | No Comments »
Agilent to Host Digitizer Performance Webcast
Friday, November 21st, 2008This webcast will evaluate the non-banner specifications of waveform digitizers. The discussion will include looking beyond the specification sheet’s usual banner listings into such topics as bandwidth, sampling rate, bit resolution and memory depth. A host of performance criteria will be taken into account to determine the actual measurement fidelity the digitizer system can be […]
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Signal Generators Test AM/FM/RDS And HD Radio Receivers
Thursday, November 6th, 2008New signal generators from Rohde & Schwarz support both HD Radio technology and AM/FM/RDS. HD Radio is iBiquity Digital Corporation’s brand of in-band on-channel (IBOC) technology.
The range of broadcast signal generators from Rohde & Schwarz includes the R&S SFE100 test transmitter, the R&S SFE broadcast tester and the R&S SFU broadcast test system. The […]
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DC Power Supplies Measure Battery Standby, Sleep-Mode Currents
Wednesday, March 26th, 2008Agilent Technologies has introduced two modules for its N6700 Modular Power System family that measure microamp current for a device under test (DUT). For R&D engineers designing integrated circuits and electronic devices that run on batteries, these power supplies measure current consumption and its effect on battery run time. When used in Automatic Test Equipment […]
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New Scopes Tout Biggest Display, Fastest Waveform Update Rate
Tuesday, February 26th, 2008Agilent Technologies has just introduced the next-generation InfiniiVision 7000 Series of oscilloscopes.
The series offers bandwidths up to 1 GHz and a deep memory waveform update rate of up to 100,000 waveforms per second. According to Agilent, this eliminates two common errors that can cause engineers to miss critical information: unresponsive controls with deep memory […]
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New “Measurement Tips” from Agilent
Wednesday, February 6th, 2008Agilent Technologies is offering a series of measurement tips to help you make more accurate measurements. The first set of tips focus on making temperature measurements:
Tips for Making Good Thermocouple Measurements in Noisy Environments
Practical Hints for Making Fast Scans of Multiple-Sensor Systems
How to Select the Correct Temperature Sensor for your Application
Posted in Data Acquisition, Sensors, Test Equipment | No Comments »
Keithley 2008 Catalog Available
Saturday, February 2nd, 2008The 2008 Keithley Test and Measurement Product Guide is now available. It offers details and specifications on Keithley’s general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications. You can request a free copy of […]
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