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Archive for the 'Metrology' Category

Metrology Interface Could Save Millions

Tuesday, May 10th, 2005

The Automotive Industry Action Group (AIAG) announced on April 19 a proof-of-concept demonstration at the Quality Expo Conference in Rosemont, Ill. that they will release in June a common global language specification for metrology system interfaces, called dimensional markup language (DML). AIAG developed DML in partnership with the National Institute of Standards and Technology (NIST). […]

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