Archive for the 'Metrology' Category
Unit Conversions Made Simple
Wednesday, June 11th, 2008From the 6/10/08 issue of NIST Tech Beat, the e-newlsetter of the National Institute of Standards and Technology:
Relax, even scientists can sometimes use help when making conversions and measurements with the modern metric system, the International System of Units (known as SI from the French “Le Systeme International d’Unites”.) The good news is that the […]
Posted in Metrology | No Comments »
Uncertain About Measurements?
Saturday, June 2nd, 2007I got this via e-mail today:
II Advanced School on Evaluation of Uncertainty in Measurement
Rio de Janeiro, Brazil - 10-14 December 2007
http://www.inmetro.gov.br/uncertaintyschool
I’m uncertain whether or not I need to attend this school (although I probably do), but I am certain that I’d like to go to Rio de Janeiro.
Posted in Metrology | No Comments »
Hart Scientific Catalog Available Online or by CD
Monday, February 19th, 2007You can now orrder Fluke’s Hart Scientific catalog on CD or download it from the internet.
The catalog not only contains product information, but articles on topics such as:
Improving SPRT stability and accuracy
Traceability and thermometric fixed-point cells
Stem conduction errors
Thermistors and thermocouples
Avoiding water problems in cold baths
…Plus, the roots of the Hart Scientific rutabaga!
The catalog CD also […]
Posted in Metrology | No Comments »
NIST Report Tags Measurement Challenges
Thursday, February 15th, 2007From the February 17, 2007 NIST Tech Beat:
A new report from the National Institute of Standards and Technology (NIST), An Assessment of the United States Measurement System: Addressing Measurement Barriers to Accelerate Innovation, details results of the agency’s first-ever assessment of the capacity of the nation’s measurement infrastructure—a large, diverse collection of private and public-sector […]
Posted in Metrology | No Comments »
Measurement Science Conference - January 22 - 26, 2007
Monday, November 6th, 2006The Measurement Science Conference consists of seminars, workshops and tutorials. The conference will be held at the Long Beach Convention Center from January 22 - 26, 2007. The first two days will be devoted to NIST Seminars. The Seminars will be followed up with a series of Tutorial Workshops and on the final two […]
Posted in Metrology, Shows & Conferences | No Comments »
ASAM User Days October 24-25 in Pontiac, MI
Wednesday, September 21st, 2005The Association for Standardization of Automation and Measuring Systems (ASAM) is an auto industry trade group developing standards for data models, interfaces, and syntax specifications for a variety of applications (e.g. testing, evaluation, simulation).
ASAM User Days will be held on October 24-25, 2005 at the Tom Davis General Motors Conference Center, Pontiac, MI. This year, […]
Posted in Metrology, Standards, Test Software | No Comments »
2005 Keithley Award Goes to Dr. Clark A. Hamilton
Monday, September 5th, 2005The IEEE has named Dr. Clark A. Hamilton the recipient of the 2005 IEEE Joseph F. Keithley Award in Instrumentation and Measurement. Hamilton, President and CEO of VMetrix, LLC, in Boulder, Colorado, is being recognized for making the DC Josephson junction array voltage standard a practical reality. His work has revolutionized the field of […]
Posted in Industry News, Metrology | No Comments »
Davis Inotek Acquires Northwest Calibration Systems
Thursday, July 21st, 2005Davis Inotek Calibration Laboratory has acquired Northwest Calibration Systems (NCS), expanding their capacity and coverage. According to the company, the acquisition will make it easier for their customers to obtain calibration certifications, reduce turn-around time, and provide better onsite calibration services.
Northwest Calibration Systems has facilities in Seattle and Portland (Vancouver) and provides services in linear/dimensional, […]
Posted in Metrology, Test Labs | No Comments »
Article Guides Users in Pressure Sensor Selection and Use
Friday, July 15th, 2005I love reading articles on measurement. Maybe that’s one reason I liked working for Test&Measurement World so much. When I was an editor there, we started a series called the “Basic Measurement Series” that covered topics such as four-wire resistance measurements and low-voltage measurements.
In that vein, is the article, “Choosing, Using, and Troubleshooting Your Piezoelectric […]
Posted in Metrology | No Comments »
www.sensorsportal.com now sports a user forum
Monday, June 20th, 2005The International Frequency Sensor Association (IFSA) runs a very nice website at www.sensorsportal.com. They recently added a bulletin board to allow users to discuss topics of interest. According to Sergey Y. Yurish, Editor-in-Chief,
Topics of discussion on the forum are not limited. It is intended to meet the individual needs […]
Posted in Metrology, Test Equipment | No Comments »
