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Archive for the 'Inspection/Vision Sytems' Category

App Notes from National Instruments

Thursday, October 9th, 2008

NI has recently released three app notes that many automotive engineers will find useful:

Automated Automotive Body Inspection System for Poka-Yoke Production Lines Using NI IMAQ Vision
Developing a Strain Measurement Solution Using NI LabVIEW Software and Data Acquisition Hardware
Developing a Hardware-in-the-Loop, High-Speed Simulation and Data Acquisition System for ECU Testing with the NI PXI Platform and […]

Posted in Data Acquisition, Environmental/Durability Test, Inspection/Vision Sytems | No Comments »

NIST Develops New Approach to Surface Profiling

Thursday, January 31st, 2008

From the January 8, 2008 issue of NIST Tech Beat:

Researchers at the National Institute of Standards and Technology (NIST) have developed a novel technique for measuring the roughness of surfaces that is casting doubt on the accuracy of current procedures. Their results announced in a forthcoming paper* could cut development costs for automakers as they […]

Posted in Inspection/Vision Sytems, Materials Test | No Comments »

GE to Acquire phoenix|x-ray

Tuesday, July 31st, 2007

GE Inspection Technologies has signed a definitive agreement to acquire phoenix|x-ray, which manufactures high-resolution computed tomography (CT) / X-Ray technology used in non-destructive testing (NDT) applications. The transaction, terms of which are not being disclosed, will be completed upon receipt of regulatory approvals.
The acquisition will broaden GE’s offerings for NDT customers in various industries, including […]

Posted in Business News, Inspection/Vision Sytems | No Comments »

SMT Magazine to Host Inspection Webcast

Friday, June 16th, 2006

SMT magazine is hosting a webcast describing different inspection methods for electronics assemblies on Wednesday, July 19. The webcast will last one hour and take place at 1:00 PM EDT. Here’s the description from the SMT website:
Industry experts compare the types of methods used for inspecting boards, looking specifically at four distinct times in the […]

Posted in Electronics Test, Inspection/Vision Sytems | No Comments »

ClearVue Wins Best-in-Test Award

Monday, December 26th, 2005

ClearVue 3D X-Ray inspection technology from Teradyne (Boston, MA) was selected by Test & Measurement World magazine to receive a ‘Best in Test’ award. The prestigious award, which annually honors test industry products that offer a significant technological advancement to the market, will be presented at a ceremony held during the APEX Conference and Exposition […]

Posted in Inspection/Vision Sytems | No Comments »

New Company Provides Laser Measurement and Vision Systems

Friday, November 4th, 2005

Metrology Resource was recently formed to provide vision system solutions and turnkey installation and support for a wide range of sensors, including surface scanners and single point sensors. Heading the Detroit office is David Allen, a veteran of over 25 years experience in laser measuring devices and instruments and controls with companies such as Keyence […]

Posted in Industry News, Inspection/Vision Sytems | No Comments »


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