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Archive for the 'IC Test' Category

Programmable Logic Product Families First to Be AEC-Q100 Certified

Monday, April 24th, 2006

The MachXO Crossover Programmable Logic Devices and ispMACH 4000V CPLD devices have been characterized and qualified to meet the certification requirements of the AEC-Q100 standard as defined by the Automotive Electronics Council (AEC). Designated the LA-MachXO™ and LA-ispMACH™ 4000V product families, these are the first programmable Lattice Automotive, or LA, devices. Production quantities […]

Posted in IC Test | No Comments »

SAE and ZVEI to Develop Auto IC Standard

Sunday, October 16th, 2005

The Society of Automotive Engineers (SAE International) and ZVEI–the German Electrical and Electronic Manufacturers’ Association–recently agreed to jointly develop a new qualification standard for semiconductors.
When finalized, the “Robustness Validation” standard should help users discover the physical limits of semiconductors used in automotive applications and will form the basis of risk analysis. In addition to […]

Posted in IC Test, Standards | No Comments »


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