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Archive for the 'Automatic Test Equipment' Category

Agilent Publishes Handbook for Test Engineers

Thursday, September 20th, 2007

Available for immediate download, this 200-page (5.0 Mbyte PDF file), full-color technical guidebook provides an overview on building test systems, including a strong emphasis on LXI. Topics include an introduction to test-system design, selection of software and hardware architecture, how to maximize system throughput, and exploring the range of networking options available for test system […]

Posted in Automatic Test Equipment, Test Software | No Comments »

Test System Offers High Throughput Switching, LXI Class B, and Optional DMM

Monday, September 17th, 2007

The Keithley Instruments Series 3700 System Switch/Multimeter and Plug-in Card Family offers both high-throughput switching and integrated digital multimeter (DMM). It offers instrument grade switching for a wide variety of applications, including high channel count applications, with its ability to control up to 576 multiplexer channels in a six-slot, 2U form factor. A high-performance integrated […]

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PXI Turns Ten

Friday, September 14th, 2007

This is taken almost directly from a PXI Systems Alliance press release, so that’s why it sounds a little “fluffy.”……Dan
The PXI, aka PCI eXtensions for Instrumentation, specification, the PC-based modular I/O platform for test, measurement and control systems has just turned ten. The PXI standard was introduced in 1997 as a modular instrumentation platform for […]

Posted in Automatic Test Equipment, Data Acquisition, Standards | No Comments »

Switch Matrix Handles 2 Amps

Tuesday, September 11th, 2007

The Pickering 40-566 Switch Matrix is a 2 Amp 2 pole switch matrix based on the company’s BRIC architecture. The new module is available in a variety of 2 pole matrix configurations ranging from 55×4 to 385×4. Each version supports 2 A hot switching and voltages up to 250 VAC.
The BRIC4 form factor occupies 4 […]

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NIST Measures Challenges for Wireless in Factories

Tuesday, September 4th, 2007

This is from the August 30, 2007 issue of NIST Tech Beat. It’s not about automotive testing, per se, but may be of interest if you’re setting up a wireless network to gather production test data……….Dan
Factories have much to gain from wireless technology, such as robot control, RFID tag monitoring, and local-area network (LAN) communications. […]

Posted in Automatic Test Equipment, Network Test | No Comments »

PXI System Features Fast Digital Test

Monday, September 3rd, 2007

The Rohde and Schwartz TS-PHDT high-speed digital test module for the PXI-based R and S CompactTSVP production test platform enables fast digital functional testing even in applications where large amounts of data have to be handled. The new option features a maximum data rate of 40MHz and a storage capacity of 1.5Gbyte.
All stimulus, nominal and […]

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Device Syncs LXI Instruments

Friday, August 31st, 2007

The Agilent Technologies E5818A LXI trigger box enables precise synchronization over LAN for LXI Class C and GPIB instruments, elevating their performance to LXI Class B standards. The unit is a standalone LXI Class B device. It can achieve a synchronization accuracy of up to 13 ns (standard deviation over direct connection) and provide time […]

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