Bruker AXS VANTEC-2000 X-ray Detector Wins R&D 100 Award

July 18th, 2005

The Bruker AXS VANTEC-2000 detector has won a 2005 R&D 100 Award, an award given out by R&D Magazine to the 100 most significant products of the year. The awardees are selected by an independent panel of judges and the editors of R&D Magazine.

The VANTEC-2000 measures a two-dimensional X-ray diffraction pattern from a test sample, allowing users to determine a wide variety of physical parameters. Because of its ability to detect individual photons at up to 2 million counts per second, the detector can be used to analyze weakly or strongly scattering samples - including smallest sample traces, single crystals, epitaxial thin films, coatings, rocks, polymers, metals, steel, wood, plastics, liquids, nanomaterials and more.

Bruker AXS is a supplier of X-ray systems that allow users to analyze the molecular structure of material using X-ray crystallography, X-ray diffraction and X-ray fluorescence. Its systems have particular application in the life science, materials science, and nanotechnology research fields. For more information, please visit the Bruker website.

Entry Filed under: Materials Test