
July 20th, 2007
What: This three-part series will explore a comparison of LXI and PXI measurement platforms, journey into maximizing the usefulness of each platform and then look at optimizing system performance using smart instruments in LXI.
Who: Design validation engineers and managers in the automotive, medical, industrial, communication and aerospace & defense industries. You may have product test responsibility and are evaluating future test needs or want to learn about new test technologies and trade-offs between test architectures
When: The first one-hour session will be held on July 24, 2007 and the series will finish on September 26, 2007. Content will also be available for on-demand viewing for those who cannot attend the live event.
Where: Sign up online for the series.
Entry Filed under: Data Acquisition, Everything Else
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