September 20th, 2007
Available for immediate download, this 200-page (5.0 Mbyte PDF file), full-color technical guidebook provides an overview on building test systems, including a strong emphasis on LXI. Topics include an introduction to test-system design, selection of software and hardware architecture, how to maximize system throughput, and exploring the range of networking options available for test system automation.
Chapters include:
- Introduction to Test-System Design
- Computer I/O Considerations
- Understanding Drivers and Direct I/O
- Choosing Your Test-System Software Architecture
- Choosing Your Test-System Hardware Architecture and Instrumentation
- Understanding the Effects of Racking and System Interconnections
- Maximizing System Throughput and Optimizing System Deployment
- Operational Maintenance
- Using LAN in Test Systems: The Basics
- Using LAN in Test Systems: Network Configuration and Basic Security
- Using LAN in Test Systems: PC Configuration
- Using USB in the Test and Measurement Environment
- Using SCPI and Direct I/O vs. Drivers
- Using LAN in Test Systems: Applications
- Using LAN in Test Systems: Setting Up System I/O
- Value, Performance and Flexibility: The Promise of LXI
- Transitioning from GPIB to LXI
- Creating Hybrid Test Systems with PXI, VXI and LXI
- Assessing Synthetic Instruments
- Optimizing the Elements of an RF/Microwave Test System
- Six Hints for EnhancingMeasurement Integrity in RF/ Microwave Test Systems
- Calibrating Signal Pathsin RF/Microwave Test Systems
- Glossary of Test-System Development Terms
It looks like there’s a lot of good stuff there…………Dan
Entry Filed under: Automatic Test Equipment, Test Software