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Test System Offers High Throughput Switching, LXI Class B, and Optional DMM System is LXI/VXI Hybrid

Agilent Publishes Handbook for Test Engineers

September 20th, 2007

Available for immediate download, this 200-page (5.0 Mbyte PDF file), full-color technical guidebook provides an overview on building test systems, including a strong emphasis on LXI. Topics include an introduction to test-system design, selection of software and hardware architecture, how to maximize system throughput, and exploring the range of networking options available for test system automation.

Chapters include:

  1. Introduction to Test-System Design
  2. Computer I/O Considerations
  3. Understanding Drivers and Direct I/O
  4. Choosing Your Test-System Software Architecture
  5. Choosing Your Test-System Hardware Architecture and Instrumentation
  6. Understanding the Effects of Racking and System Interconnections
  7. Maximizing System Throughput and Optimizing System Deployment
  8. Operational Maintenance
  9. Using LAN in Test Systems: The Basics
  10. Using LAN in Test Systems: Network Configuration and Basic Security
  11. Using LAN in Test Systems: PC Configuration
  12. Using USB in the Test and Measurement Environment
  13. Using SCPI and Direct I/O vs. Drivers
  14. Using LAN in Test Systems: Applications
  15. Using LAN in Test Systems: Setting Up System I/O
  16. Value, Performance and Flexibility: The Promise of LXI
  17. Transitioning from GPIB to LXI
  18. Creating Hybrid Test Systems with PXI, VXI and LXI
  19. Assessing Synthetic Instruments
  20. Optimizing the Elements of an RF/Microwave Test System
  21. Six Hints for EnhancingMeasurement Integrity in RF/ Microwave Test Systems
  22. Calibrating Signal Pathsin RF/Microwave Test Systems
  23. Glossary of Test-System Development Terms

It looks like there’s a lot of good stuff there…………Dan

Entry Filed under: Automatic Test Equipment, Test Software

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