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Archive for November, 2008

Nanotech, LEDs, and Coordinate Measurements. Oh my!

Thursday, November 27th, 2008

The November 25 issue of the NIST Tech Beat is chock full of good stuff for auto test engineers:

NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
Bright Idea Illuminates LED Standards
NIST Leads Revision of International Coordinate Measuring Machine Standard

Posted in Component Test, Sensors | No Comments »

New Lit on Auto Transient Generator Test Systems

Monday, November 24th, 2008

AR RF Microwave Instrumentation has released new literature with comprehensive information on its innovative test systems for conductive immunity and automotive transient generator testing. The new brochure includes AR’s CI (Conducted Immunity) Systems, self-contained, all-in-one test systems; and the company’s TGAR Systems for automotive transient generator testing.
The CI Systems are designed to make RF conducted […]

Posted in EMC Test | No Comments »

Agilent to Host Digitizer Performance Webcast

Friday, November 21st, 2008

This webcast will evaluate the non-banner specifications of waveform digitizers. The discussion will include looking beyond the specification sheet’s usual banner listings into such topics as bandwidth, sampling rate, bit resolution and memory depth. A host of performance criteria will be taken into account to determine the actual measurement fidelity the digitizer system can be […]

Posted in Test Equipment | No Comments »

Choosing a DAQ Vendor

Friday, November 21st, 2008

Here’s an article I wrote for Test&Measuerment World after attending the latest Auto Test Expo. It really amazed me that there were so many data-acquisition vendors there. It has to be awfully difficult for any one of them to really stand out. Even the smallest of them has their niche, though.

Posted in Data Acquisition | No Comments »

High-Resolution LXI Digitizers Stand Alone

Thursday, November 20th, 2008

The Agilent Technologies L4532A 2-channel and L4534A 4-channel digitizers are high-performance, stand-alone LXI digitizers that offer simultaneous sampling at up to 20 MS/s, and with 16-bit resolution. Agilent claims that these products represent a new category of digitizers with their robust input channel and high performance analog-to-digital (A/D) design, and on-board measurements. The isolated […]

Posted in Data Acquisition | No Comments »

App Note Discusses Auto Multimedia Test App

Thursday, November 20th, 2008

One of National Instruments‘ latest app notes, “Developing Test Systems for Automotive Multimedia Devices Using NI TestStand and PXI Hardware” discusses how a German company used NI hardware and software to develop a test for several different automotive entertainment systems.
Using PXI data acquisition modules and Test Stand software, the system performs the following tests:

Audio […]

Posted in Automatic Test Equipment | No Comments »

MGA Research Opens SC Facility

Monday, November 17th, 2008

MGA recently made the decision to open a facility that will support its customer-base in the southern region of the United States. In August, MGA opened a brand new 15,000 square foot facility located in Greer, South Carolina. This facility is literally located right in the backyard of the BMW Performance Center off […]

Posted in Test Labs | No Comments »

ISO 9001 Updated

Monday, November 17th, 2008

ISO 9001:2008, Quality Management System — Requirements, has recently been updated. ISO 9001:2008 is the fourth edition of the standard first published in 1987. This standard has become the benchmark for providing assurance and is the key element for maintaining ISO 9000 certification. It’s available from the American National Standards Institute (ANSI).
For […]

Posted in Standards | No Comments »

Sensor Measures Steering Drift Pull

Thursday, November 13th, 2008

The Sensor Developments Model 90408 measures steering drift pull and features an integrated strain gaged based sensor and gravitational angle measurement system. It is interfaced and powered USB cable connected to a portable laptop. The interface software features a very easy to use setup screen and display. Pre-program test lengths and […]

Posted in Sensors | No Comments »

U.S. Army Debuts $8.8 Million High-Speed Test Track

Tuesday, November 11th, 2008

The United States Army will build a 4.5-mile, high-speed test track at Aberdeen Proving Ground in Harford County, Maryland.
Both wheeled and tracked vehicles will be tested at sustained high speeds at the new military test track. Some of the military vehicles will be heavily armored and weigh as much as 119 tons.
The track will be […]

Posted in Test Labs | No Comments »


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