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The November 25 issue of the NIST Tech Beat is chock full of good stuff for auto test engineers: NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials AR RF Microwave Instrumentation has released new literature with comprehensive information on its innovative test systems for conductive immunity and automotive transient generator testing. The new brochure includes AR’s CI (Conducted Immunity) Systems, self-contained, all-in-one test systems; and the company’s TGAR Systems for automotive transient generator testing. The CI Systems are designed to make RF conducted immunity . . . → Read More: New Lit on Auto Transient Generator Test Systems This webcast will evaluate the non-banner specifications of waveform digitizers. The discussion will include looking beyond the specification sheet’s usual banner listings into such topics as bandwidth, sampling rate, bit resolution and memory depth. A host of performance criteria will be taken into account to determine the actual measurement fidelity the digitizer system can be given. . . . → Read More: Agilent to Host Digitizer Performance Webcast Here’s an article I wrote for Test&Measuerment World after attending the latest Auto Test Expo. It really amazed me that there were so many data-acquisition vendors there. It has to be awfully difficult for any one of them to really stand out. Even the smallest of them has their . . . → Read More: Choosing a DAQ Vendor The Agilent Technologies L4532A 2-channel and L4534A 4-channel digitizers are high-performance, stand-alone LXI digitizers that offer simultaneous sampling at up to 20 MS/s, and with 16-bit resolution. Agilent claims that these products represent a new category of digitizers with their robust input channel and high performance analog-to-digital (A/D) design, and on-board measurements. The isolated input . . . → Read More: High-Resolution LXI Digitizers Stand Alone |
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