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Archive for October, 2007

Functional Test System Features Low-Cost, Small-Footprint

Tuesday, October 30th, 2007

The Agilent TS-5040 is a scalable system in a 0.75m rack designed for testing automotive body control and safety electronic modules with just enough test capabilities to minimize cost of test. The new Agilent TS-5040 automotive functional test system has the flexibility to perform RF standalone tests, such as remote keyless entry and tire pressure […]

Posted in Electronics Test | No Comments »

Catalog Features Wireless and Networked Systems

Tuesday, October 30th, 2007

Computer Aided Solutions’ 2008 catalog of data logging and data acquisition systems includes products that monitor input signals from temperature, humidity, pressure, flow, voltage, current and other digital sources with sampling rates from 1 Hz to over 10 kHz. These data loggers can be connected via traditional serial interface (RS232/422/485), USB, Ethernet, Bluetooth, short or […]

Posted in Data Acquisition | No Comments »

Probes Help Make Scope Measurements in Extreme Temperatures

Tuesday, October 30th, 2007

The Agilent N5450A InfiniiMax extreme-temperature extension cable, used with the InfiniiMax Series probing system and Agilent Infiniium oscilloscopes, gives engineers the ability to probe signals at temperatures ranging from -55 C to 150 C. An example of such an application would be testing devices inside an environmental chamber. Until now, testing in extreme temperature ranges […]

Posted in Test Equipment | No Comments »

AUTO TEST EXPO:
SIMulation Workbench Controls Complex MATLAB/Simulink Simulations

Sunday, October 28th, 2007

Concurrent Computer’s SIMulation Workbench provides a complete framework to develop and execute real-time hardware-in-the-loop and man-in-the-loop simulations. Features include:

a real-time database for fast access to all model parameters and signals,
flexible support for MATLAB/Simulink models,
support for existing and new hand-written Fortran, C/C++ or Ada code based models,
support for many COTS I/O boards,
GUIs to configure, […]

Posted in Simulation | No Comments »

Auto Test Expo Gives Test Engineers a Break

Saturday, October 27th, 2007

I’ve always liked trade shows. Trade shows give you a short break from your usual work routine, let you immerse yourself completely in a particular topic, and perhaps even teach you something new. When looked at in this light, the 2007 Automotive Testing Expo in Novi, MI was a great success.
With a full schedule […]

Posted in Everything Else | No Comments »

Wafer Test and Burn-In System Tests 15 Wafers At a Time

Wednesday, October 24th, 2007

The Aehr Test FOX-15 full wafer contact test and burn-in system performs parallel testing and burn-in on up to 15 wafers. As with all members of the FOX product family, the FOX-15 contacts every die on each wafer simultaneously.
“The FOX-15 system is designed for use with wafers that require test and burn-in times typically measured […]

Posted in Electronics Test | No Comments »

New Crash Tests Required by November 2007

Tuesday, October 23rd, 2007

NHTSA modified Part 571 in September, incorporating a dynamic pole test and the enhancingthe moving deformable barrier test for FMVSS 214 side impact testing. The final rule will be effective November 13, 2007.
This final rule incorporates a dynamic pole test into FMVSS 214, ‘‘Side impact protection.’’ To meet the test, vehicle manufacturers will need […]

Posted in Business News, Safety Test | No Comments »

Mobi-Pack Analyzes Multiple Vibration Channels in the Field

Monday, October 22nd, 2007

The Oros Mobi-Pack is a 16-channel, all-in-one vibration analyzer designed for tough field environments. Its rugged and light weight design lets it be checked with luggage or even carried on board an aircraft. Shocks and vibrations during transport or even operation will not prevent it from acquiring the critical data it is meant to capture.
Features […]

Posted in NVH, Test Equipment | No Comments »

New Mileage Tests More Realistic

Sunday, October 21st, 2007

In today’s Washington Post, there’s an article on new mileage ratings for 2008 models. According to the article, “The Benefits of Truth in Mileage,” the ratings are to fall anywhere from 12% to 30%. The new test take into account factors such as extreme temperature changes, varying road grades, the use of air conditioners and […]

Posted in Everything Else | No Comments »

AP Reports that Danaher yo Buy Tektronix

Tuesday, October 16th, 2007

The Associated Press has reported that Danaher Corp. is buying test and measurement equipment maker Tektronix Inc. for $2.85 billion in a move to expand its electronic testing business. The sale is set to close in the fourth quarter of 2007. Tek will join Fluke as part of Danaher’s test and measurement division.
Danaher also […]

Posted in Business News | No Comments »


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