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Archive for August, 2007

Device Syncs LXI Instruments

Friday, August 31st, 2007

The Agilent Technologies E5818A LXI trigger box enables precise synchronization over LAN for LXI Class C and GPIB instruments, elevating their performance to LXI Class B standards. The unit is a standalone LXI Class B device. It can achieve a synchronization accuracy of up to 13 ns (standard deviation over direct connection) and provide time […]

Posted in Automatic Test Equipment, Data Acquisition | No Comments »

Rood Testhouse, SensorDynamics Partner

Friday, August 31st, 2007

Rood Testhouse International N.V. (Rood Technology) and SensorDynamics have signed an agreement under which Rood will provide testing and qualification services for Sensor Dynamics’ MEMS (micro-electromechanical systems). The partnership concerns all existing and yet to be developed microsensor systems.
For this partnership, Rood Technology has invested in an EDA monitoring ‘burn-in’ system, the biggest in Europe […]

Posted in Business News, Test Labs | No Comments »

VIASPACE Working on Clean Energy Product Strategy

Wednesday, August 29th, 2007

This item is derived from a press release that is a puff piece for Viaspace, but the information about the company’s humidity sensor might be interesting to some readers……..Dan
Viaspace is a company commercializing technologies from NASA and the US Department of Defense. Their product line includes battery and fuel cell test equipment.
One of these products […]

Posted in Business News, Emissions Test, Powertrain Test | No Comments »

Screw Mounting Accelerometer Best for High-Temp Application

Friday, August 24th, 2007

From the Endevco Measurement Endeavor e-mail newsletter comes this tip for mounting accelerometers at temps above 250 deg F:
There are several options for mounting devices to each other at that temperature. Screw mounting an accelerometer is always best. There is no problem handling temperature if properly torqued (see relevant product data sheet for correct mounting […]

Posted in Sensors | No Comments »

Marine Standard Useful for Auto Applications?

Friday, August 24th, 2007

I get a lot of e-mail, including the Monitor, an e-mail newsletter from Windmill Software in the UK. In their latest issue, they make reference to NMEA 2000, a standard drafted by the National Marine Electronics Association that defines the requirements of a serial data communications network to inter-connect marine electronic equipment on vessels.
While written […]

Posted in Data Acquisition, Standards | No Comments »

GE Inspection Technologies to acquire phoenix|x-ray

Thursday, August 23rd, 2007

GE Inspection Technologies has signed a definitive agreement to acquire phoenix|x-ray, a leader in high-resolution computed tomography (CT) / X-ray technology used in non-destructive testing (NDT) applications. The transaction will be completed upon receipt of regulatory approvals. Terms of the deal were not disclosed.

Posted in Business News | No Comments »

PCB Piezotronics Forms Automotive Division

Thursday, August 23rd, 2007

PCB Piezotronics recently announced that it has opened a sales and technical support facility, located in Novi, MI, devoted exclusively to the global automotive test market, including vehicle NVH and dynamics, vehicle and component durability, legislative and safety, crash, and powertrain testing applications.
Appointed to lead this newly formed division as Director of Sales & Marketing […]

Posted in Business News | No Comments »

Podcasts Recap LXI China Meeting

Thursday, August 23rd, 2007

A series of podcasts has been posted on the LXI Consortium website that provide insights into the present and future status of LXI in China. The podcasts were recorded at the LXI General Meeting in Beijing, China, held last month.
The podcasts are available in both English and Chinese and a link to the podcasts can […]

Posted in Data Acquisition | No Comments »

Series Focuses on ADC, DAC Theory and Use

Thursday, August 23rd, 2007

Audio DesignLine has been running a series of articles on analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). Written by two engineers at Analog Devices, the series focuses on their use in digital signal processing (DSP) systems. Good stuff!

Part 1 introduces the concept of sampling and explains Nyquist’s sampling criteria and how to use undersampling and […]

Posted in Data Acquisition, Test Equipment | No Comments »

Testing Begins at Indian Auto Test Facility

Tuesday, August 21st, 2007

The Economic Times reports testing has begun at the National Automotive Testing and R&D Infrastructure Project (NATRiP) facility at Manesar. Even though testing has begun, the 42-acre facility won’t be complete for another two years.

Posted in Test Labs | No Comments »


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