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Archive for June, 2007

Avoid Instrument Amp Mistakes

Tuesday, June 12th, 2007

Automotive DesignLine has a nice article written by Matthew Duff of Analog Devices on five mistakes to avoid when using instrumentation amplifiers. These mistakes include:

RFI rectification,
common-mode range,
voltage protection,
driving the reference pin, and
floating voltages.

Posted in Test Equipment | No Comments »

Design Verification Tool Automates Test Generation

Friday, June 8th, 2007

MathWorks Simulink Design Verifier generates tests and proves design properties for Simulink and Stateflow models. Model-Based Design is becoming widely used for embedded system development, moving from R&D and proof-of-concept projects into production programs
Engineers can generate test inputs that satisfy standard coverage objectives as well as user-defined test objectives and requirements. These […]

Posted in Simulation | No Comments »

GPIB Lives!

Thursday, June 7th, 2007

The Agilent 82351A PCIe-GPIB is a half-height interface card for compact next-generation PCs that harnesses the fast data transfer rate of PCI Express to support high-bandwidth PC applications. The card provides a 1.4 MB/s data rate in a 68.9 mm (half-height) plug-in card. It also provides the flexibility of up-plugging, which makes it possible […]

Posted in Data Acquisition, Test Equipment | No Comments »

LXI for Auto Test

Wednesday, June 6th, 2007

Automotive Design Line, an online publication of CMP, is running an article by Steve Stetler of Agilent on LXI instrumentation. The article, titled “Use LAN eXtensions for Instrumentation (LXI) for automobile electronics testing,” is kind of basic, but a good intro to the topic.

Posted in Data Acquisition, Test Equipment | No Comments »

Test House Adds Conformal Coating Service

Monday, June 4th, 2007

C-MAC MicroTechnology has added a conformal coating service to its ISO 17025 accredited test house offering.
Conformal coating with a translucent acrylic or polyurethane material is vital for the long-term reliability of electronic systems and offers excellent protection from condensation and airborne contaminates. The coating is applied by either dipping or spraying with meticulous […]

Posted in Electronics Test, Test Equipment | No Comments »

Uncertain About Measurements?

Saturday, June 2nd, 2007

I got this via e-mail today:

II Advanced School on Evaluation of Uncertainty in Measurement
Rio de Janeiro, Brazil - 10-14 December 2007
http://www.inmetro.gov.br/uncertaintyschool

I’m uncertain whether or not I need to attend this school (although I probably do), but I am certain that I’d like to go to Rio de Janeiro.

Posted in Metrology | No Comments »

JTAG Software Gains Test Coverage Analysis, Expanded Library

Friday, June 1st, 2007

JTAG Technologies has just released a new version of JTAG ProVision”. Developers will now be able to evaluate their designs for boundary-scan test coverage within the ProVision environment. Precise quantitative results for testability — both theoretical coverage and the actual achieved level — are presented on a net-basis and pin-basis. The theoretical or maximum attainable […]

Posted in Test Software | No Comments »


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