Arendar 2007 Features New Report Designer, Data Mining

VI Technology, Inc. recently announced Arendar 2007, its enterprise-level test data management software package. New features include a drag-and-drop report designer with one-click Web publishing of interactive reports, a fully user-customizable Web Dashboard, secure data transfers through firewalls, and interactive data mining of swept parametric data.

Arendar 2007 also comes with a new application programming interface . . . → Read More: Arendar 2007 Features New Report Designer, Data Mining

Oil Oxidation Testing Explained

Practicing Oil Analysis has an article on oil oxidation tests that includes tests for automotive oil. The article, The Lubricant’s Nemesis – Oxidation, explains how to develop and analyse an . . . → Read More: Oil Oxidation Testing Explained

Ford to Sell AZ Proving Ground

Ward’s Auto World is reporting that Ford Motor Co. is selling or dramatically reducing the size of its 3,400-acre (1,375-ha) Arizona Proving Ground in Yucca, AZ.

A Ford spokesman is quoted as saying, “We certainly want to consolidate vehicle testing in North America and have made decisions to sell or scale back . . . → Read More: Ford to Sell AZ Proving Ground

LXI Consortium to Meet in Beijing

The LXI Consortium announced that its next General Meeting will be held in Beijing, China, June 19-21, 2007, the first General Meeting to be held in Asia. The Consortium’s goal is to develop a solid LXI user base in the region to promote adoption of the test instrument technology and learn more about applications particular to . . . → Read More: LXI Consortium to Meet in Beijing

Discovery Promises to Improve Semiconductor Sensors

More sensitive sensors and detectors based on semiconductor electronics could result from new findings by researchers from the United States, Norway and Russia. Their research has yielded a decisive step in identifying the origin of the universal “one-over-f” (1/f) noise phenomenon; “f” stands for “frequency.”

“One-over-f noise appears almost everywhere, from electronic devices and fatigue in materials . . . → Read More: Discovery Promises to Improve Semiconductor Sensors