By Dan Romanchik, on May 31st, 2007%
VI Technology, Inc. recently announced Arendar 2007, its enterprise-level test data management software package. New features include a drag-and-drop report designer with one-click Web publishing of interactive reports, a fully user-customizable Web Dashboard, secure data transfers through firewalls, and interactive data mining of swept parametric data.
Arendar 2007 also comes with a new application programming interface . . . → Read More: Arendar 2007 Features New Report Designer, Data Mining
By Dan Romanchik, on May 24th, 2007%
Practicing Oil Analysis has an article on oil oxidation tests that includes tests for automotive oil. The article, The Lubricant’s Nemesis – Oxidation, explains how to develop and analyse an . . . → Read More: Oil Oxidation Testing Explained
By Dan Romanchik, on May 23rd, 2007%
Ward’s Auto World is reporting that Ford Motor Co. is selling or dramatically reducing the size of its 3,400-acre (1,375-ha) Arizona Proving Ground in Yucca, AZ.
A Ford spokesman is quoted as saying, “We certainly want to consolidate vehicle testing in North America and have made decisions to sell or scale back . . . → Read More: Ford to Sell AZ Proving Ground
By Dan Romanchik, on May 22nd, 2007%
The LXI Consortium announced that its next General Meeting will be held in Beijing, China, June 19-21, 2007, the first General Meeting to be held in Asia. The Consortium’s goal is to develop a solid LXI user base in the region to promote adoption of the test instrument technology and learn more about applications particular to . . . → Read More: LXI Consortium to Meet in Beijing
By Dan Romanchik, on May 22nd, 2007%
More sensitive sensors and detectors based on semiconductor electronics could result from new findings by researchers from the United States, Norway and Russia. Their research has yielded a decisive step in identifying the origin of the universal “one-over-f” (1/f) noise phenomenon; “f†stands for “frequency.”
“One-over-f noise appears almost everywhere, from electronic devices and fatigue in materials . . . → Read More: Discovery Promises to Improve Semiconductor Sensors