By Dan Romanchik, on February 28th, 2007%
PCB Piezotronics Debuts New
Sensor Technologies & Instrumentation Catalogue
February 28, 2007, Depew, NY, USA – PCB Piezotronics, Inc. (PCB®), a PCB Group Company, has announced the North American release of its new Sensor Technologies & Instrumentation Catalogue.
The new catalogue from PCB Piezotronics includes 46 pages of product info, including detailed specifications for acceleration, acoustics, force, load, pressure, . . . → Read More: New Sensor Catalog Available
By Dan Romanchik, on February 20th, 2007%
The Analyst ems+ft is aimed at OEMs and contract manufacturers building power supplies, automotive electronics, medical electronics, industrial control modules, and consumer products whose test strategies are most cost effective when they can perform in-circuit and analog functional test on the same system. The Analyst ems+ft includes an integrated stimulus, measurement, and switching capability packaged in . . . → Read More: Test System Combines In-Circuit and Functional Test
By Dan Romanchik, on February 19th, 2007%
You can now orrder Fluke’s Hart Scientific catalog on CD or download it from the internet.
The catalog not only contains product information, but articles on topics such as:
Improving SPRT stability and accuracy
Traceability and thermometric fixed-point cells
Stem conduction errors
Thermistors and thermocouples
Avoiding water problems in cold baths
…Plus, the roots of the Hart Scientific rutabaga!
The catalog CD also contains . . . → Read More: Hart Scientific Catalog Available Online or by CD
By Dan Romanchik, on February 16th, 2007%
You can now subscribe to a new IEC service and access the IEC’s entire EMC collection online through the IEC Library server. The subscription is for a minimum of three years and includes all new editions and amendments. The collection is updated on a daily basis.
Price per year CHF 4’500.- for a one user licence (!)
To . . . → Read More: Access IEC EMC Docs Online
By Dan Romanchik, on February 15th, 2007%
From the February 17, 2007 NIST Tech Beat:
A new report from the National Institute of Standards and Technology (NIST), An Assessment of the United States Measurement System: Addressing Measurement Barriers to Accelerate Innovation, details results of the agency’s first-ever assessment of the capacity of the nation’s measurement infrastructure—a large, diverse collection of private and public-sector organizations—to . . . → Read More: NIST Report Tags Measurement Challenges