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Archive for February, 2007

New Sensor Catalog Available

Wednesday, February 28th, 2007

PCB Piezotronics Debuts New
Sensor Technologies & Instrumentation Catalogue
February 28, 2007, Depew, NY, USA – PCB Piezotronics, Inc. (PCB®), a PCB Group Company, has announced the North American release of its new Sensor Technologies & Instrumentation Catalogue.
The new catalogue from PCB Piezotronics includes 46 pages of product info, including detailed specifications for acceleration, acoustics, force, load, […]

Posted in Sensors | No Comments »

Test System Combines In-Circuit and Functional Test

Tuesday, February 20th, 2007

The Analyst ems+ft is aimed at OEMs and contract manufacturers building power supplies, automotive electronics, medical electronics, industrial control modules, and consumer products whose test strategies are most cost effective when they can perform in-circuit and analog functional test on the same system. The Analyst ems+ft includes an integrated stimulus, measurement, and switching capability packaged […]

Posted in Electronics Test | No Comments »

Hart Scientific Catalog Available Online or by CD

Monday, February 19th, 2007

You can now orrder Fluke’s Hart Scientific catalog on CD or download it from the internet.
The catalog not only contains product information, but articles on topics such as:

Improving SPRT stability and accuracy
Traceability and thermometric fixed-point cells
Stem conduction errors
Thermistors and thermocouples
Avoiding water problems in cold baths

…Plus, the roots of the Hart Scientific rutabaga!
The catalog CD also […]

Posted in Metrology | No Comments »

Access IEC EMC Docs Online

Friday, February 16th, 2007

You can now subscribe to a new IEC service and access the IEC’s entire EMC collection online through the IEC Library server. The subscription is for a minimum of three years and includes all new editions and amendments. The collection is updated on a daily basis.
Price per year CHF 4′500.- for a one user licence […]

Posted in EMC Test | No Comments »

NIST Report Tags Measurement Challenges

Thursday, February 15th, 2007

From the February 17, 2007 NIST Tech Beat:
A new report from the National Institute of Standards and Technology (NIST), An Assessment of the United States Measurement System: Addressing Measurement Barriers to Accelerate Innovation, details results of the agency’s first-ever assessment of the capacity of the nation’s measurement infrastructure—a large, diverse collection of private and public-sector […]

Posted in Metrology | No Comments »

Agilent Launches Measurement Journal

Monday, February 12th, 2007

Agilent Technologies has just launched a new, quarterly technical publication, the Agilent Measurement Journal. The goal of the journal is to help engineers stay on top of the latest test and measurement technologies and Agilent solutions. It will cover a wide range of industries, including aerospace and defense, wireless communications and industrial, and feature articles […]

Posted in Everything Else | No Comments »

2.4 GHz Wireless Sensor Nodes Get Faster

Friday, February 9th, 2007

Agile-Link wireless nodes can now stream data at rates up to 4 kHz. This increase in sample rate allows them to be used in automotive testing applications, such as impact and crash testing and vibration monitoring and modal analysis. The sensors use an open serial protocol that enables users to develop high speed applications with […]

Posted in Sensors | No Comments »

Ruggedized System Controls Dynos

Thursday, February 8th, 2007

The HOST Cell Control System (CCS) consists of a fan-less processor, compact flash storage, and a real-time operating system. This design eliminates the three most common hardware failures: processor overheating, hard drive failure, and virus susceptibility. The system is compatible with any dynamometer system and can control the dynamometer, fan, robot (throttle or throttle & […]

Posted in Powertrain Test | No Comments »

Service Measures Non-contact Vibration and Topography

Monday, February 5th, 2007

Polytec, a manufacturer of optical measurement systems for macro and microstructure vibration testing, now offers a non-contact vibration and topography measurement service. The service uses the company’s non-contact measurement technology and, if needed, the expert advice of a Polytec applications engineer.
Test structures are characterized with 1-D and 3-D scanning laser vibrometers, single-point vibrometers, microstructure (MEMS) […]

Posted in NVH, Test Labs | No Comments »


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