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Archive for November, 2006

New Measurement Guide Worth ‘Poring Over’

Tuesday, November 28th, 2006

From the November 9, 2006 NIST Tech Beat:
In industries from textiles to automobiles and from pharmaceuticals to semiconductors, accurately measuring empty spaces—technically speaking, porosity—is a substantial matter, important to efforts to ensure high product quality and low scrap rates.
This is because tiny pores—usually smaller than 50 nanometers in diameter—come in many varieties, creating complex internal […]

Posted in Everything Else | No Comments »

How to Place the Reference Transducer for Vibration Tests

Tuesday, November 28th, 2006

Endevco has just published a short app note on how to place a reference transducer on a shaker table. It starts out:
The correct mounting for the Control or Reference transducer seems to be more art than science to a great many shaker lab personnel. There are a multitude of factors to consider in conducting accurate […]

Posted in Environmental/Durability Test | No Comments »

Web Enclosures Directory Launched

Monday, November 27th, 2006

A specialized buying guide and directory of enclosure manufacturers is now available online. The new directory includes offerings from manufacturers and suppliers of all types of enclosures for industrial and construction applications. Including offerings primarily but not limited to manufacturers in the United States, Canada, Australia, United Kingdom, South Africa, New Zealand, India, China, Germany, […]

Posted in Test Equipment | No Comments »

Infineon Test Chip Helps Eliminate “VIA” Defects

Monday, November 27th, 2006

Infineon recently introduced a method that helps them avoid one of the most common causes of defects in the production of highly integrated semiconductor circuits: the electrical failure of VIA contacts. “VIA” stands for “vertical interconnect” and refers to the contact between two metal layers in integrated circuits. Infineon developed the new method in collaboration […]

Posted in Electronics Test | No Comments »

From DARPA Challenge to a Test Track Near You

Wednesday, November 22nd, 2006

The DARPA Grand Challenge is ostensibly for encouraging the development of technology for autonomous military vehicles. Some of that technology, though, may be used auto companies. That’s the hope, at least, of GrayMatter, Inc.
They’re hoping to use the technology they’ve developed to compete in the Challenge to help companies who test vehicles and automotive components […]

Posted in Everything Else, Test Labs | No Comments »

Test.Express Adds CAN-bus Interface

Wednesday, November 22nd, 2006

Test.Xpress, a noise and vibration analyzer, can now acquire data through a USB connected CAN-bus interface. This makes it easier for engineers to gather data in automotive testing applications.
Via the CAN-bus interface, automotive test engineers can capture a broad range of measurement parameters during vehicle testing, without having to add additional instrumentation. The data captured […]

Posted in Data Acquisition, NVH | No Comments »

USB Data Acq Modules and Chassis Provide Higher Bandwidth, Faster Setup

Tuesday, November 14th, 2006

The Agilent U2300A Series USB DAQ device and U2700A chassis allow you to sample at rates of up to 3 MSa/s for a single channel, enables fast and easy instrument setup, and quality data acquisition. The U2300A and the U2700A are part of Agilent Open, supporting open industry-standard software and PC-standard IO.
Agilent’s U2300A Series […]

Posted in Data Acquisition | No Comments »

TUV SUD America Acquires EST Testing Solutions

Monday, November 13th, 2006

TUV SUD America, a testing and certification services recently acquired EST Testing Solutions, an environmental and electromagnetic compatibility (EMC) testing company specializing in providing services to the automotive and furniture industries.
For more information, visit the TUV website or the EST website.

Posted in Business News, Environmental/Durability Test | No Comments »

PXI System Tests Variety of Radios

Monday, November 13th, 2006

The Universal Radio Tester (URT) generates analog and digital radio signals such as AM, FM, RDS, XM®, Sirius®, HD Radio® (IBOC) and Digital Audio Broadcast (DAB). The URT uses National Instruments LabVIEW, TestStand, and the latest PXI modular instruments, consists of a PXI chassis, an embedded PXI controller and the PXI-5671 2.7 GHz RF […]

Posted in Electronics Test | No Comments »

From the November Auto EMC Net Newsletter

Thursday, November 9th, 2006

Here are a couple of items of interest to test engineers from the Automotive EMC Network:

UK EMC Test ClubWhile attending a recent PCB Designers Symposium we came across this novel idea in the UK for a collaborative EMC test club. Although the company currently is not capable of performing Automotive tests, it’s an interesting […]

Posted in EMC Test | No Comments »


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