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Archive for August, 2005

Kits support modular electronic instrument development

Wednesday, August 31st, 2005

Agilent is now shipping LXI IEEE-1588 demonstration kits to members of the LXI Consortium to help them design interoperable instruments and to further develop the IEEE-1588 standard. Agilent Laboratories developed the kit for its own LXI research and development, which is a LAN-based platform for automated test systems. The platform enables several instruments to synchronize […]

Posted in Standards, Test Equipment | No Comments »

Machine Tests How Tires React to Loads

Monday, August 29th, 2005

The Load/Deflection Test Machine is designed to test how tires react under various types of loads, from the expected to the excessive. It can supply radial loading up to 100,000 pounds, lateral loading to 50,000 pounds, and torsional loading to 15,000 pounds.
The test machine can accommodate a tire/wheel assembly from 10- to 24-inches wide and […]

Posted in Everything Else | No Comments »

Practical Circuits and Interface Techniques for MEMS Accelerometers with Quasi-Digital Output

Friday, August 26th, 2005

This application-specific article by Sergey Yurish, who publishes the electronic publication Sensors & Transducers Magazine, describes a practical circuits and interface techniques quasi-digital MEMS accelerometers. This design approach is based on the Universal Frequency-Digital Converter (UFDC-1) working well with any frequency-time domain sensors. approach lets significantly simplify the design process, reduce time-to-market and production and […]

Posted in Test Equipment | No Comments »

Safety Systems Drive Automotive Electronics Growth

Tuesday, August 23rd, 2005

Safety systems, such as tire pressure monitors and lane departure warning systems, will be the engine behind continued growth in the automotive electronics market, according to the global research and consulting company Strategy Analytics. Its new report, “Automotive System Demand 2003 to 2012,” forecasts that the global market for automotive electronics will rise from $36 […]

Posted in Everything Else | No Comments »

Interactive CD Aids Troubleshooting

Monday, August 22nd, 2005

A tutorial CD titled “Interactive Test & Measurement Troubleshooting Guide: How to Avoid Common Measurement Errors” is now available from Keithley. The CD lets users explore the symptoms and causes of common errors associated with low-level signals, such as low voltage, low current, low resistance, high resistance, and voltage from a high resistance source measurement. […]

Posted in Test Equipment | No Comments »

Funding Authorized by NC Legislature for Advanced Vehicle Research Center

Friday, August 19th, 2005

A combination of state and local investment has been secured to build the Advanced Vehicle Research Center (AVRC), an independent automotive proving ground in Eastern North Carolina. Northampton County will provide the 630-acre site as part of an economic development initiative. Start-up funding was authorized by the North Carolina General Assembly in August of 2005.
As […]

Posted in Test Labs | No Comments »

Kit Includes Automotive Multimeter and IR Thermometer

Thursday, August 18th, 2005

The Fluke 88V-IR Automotive Multimeter Combo Kit includes the 88V Automotive Multimeter, the MiniTemp MT6 Infrared Automotive Thermometer, and a full set of accessories for troubleshooting and diagnosing problems on virtually any conventional or hybrid vehicle.
Specifically designed for reliability and added user safety in automotive troubleshooting applications, the 88V Automotive Multimeter has a limited lifetime […]

Posted in Test Equipment | No Comments »

New Products are Hot in Austin This Week

Wednesday, August 17th, 2005

This is NI Week, which means it’s a (literally) hot time in Austin for all of you rabid National Instruments fans. As always, they introduce a number of new products. Here are a couple that have application in automotive testing.
MXI-Express Delivers PCI Express Control of PXI
Engineers now can use MXI-Express kits for PCI Express control […]

Posted in Data Acquisition | No Comments »

Sensors Measure Millions of Durability Test Cycles

Wednesday, August 17th, 2005

The Series 200B, 200C and 210B piezoelectric dynamic impact force sensors accurately measure dynamic impact force. Unlike strain gage sensors that are suitable for measuring static loads, dynamic impact force sensors possess the necessary response and endurance to accurately follow fast-rising, repetitive and short-duration force events such as actuation or operation of various automotive accessories […]

Posted in Environmental/Durability Test | No Comments »

Volunteers Needed for Driveline Committee

Tuesday, August 16th, 2005

SAE is currently seeking volunteers for the Driveline Standards Committee. The committee’s goal is to identify the needs, and develop, collect, and disseminate technical information relate to vehicle and equipment drivelines, including test procedures and techniques. Those interested in volunteering should e-mail Patrick Kurzeja or Cindy Reese.

Posted in Powertrain Test, Standards | No Comments »


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