Agilent is now shipping LXI IEEE-1588 demonstration kits to members of the LXI Consortium to help them design interoperable instruments and to further develop the IEEE-1588 standard. Agilent Laboratories developed the kit for its own LXI research and development, which is a LAN-based platform for automated test systems. The platform enables several instruments to synchronize their . . . → Read More: Kits support modular electronic instrument development
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The Load/Deflection Test Machine is designed to test how tires react under various types of loads, from the expected to the excessive. It can supply radial loading up to 100,000 pounds, lateral loading to 50,000 pounds, and torsional loading to 15,000 pounds. The test machine can accommodate a tire/wheel assembly from 10- to 24-inches wide and up . . . → Read More: Machine Tests How Tires React to Loads This application-specific article by Sergey Yurish, who publishes the electronic publication Sensors & Transducers Magazine, describes a practical circuits and interface techniques quasi-digital MEMS accelerometers. This design approach is based on the Universal Frequency-Digital Converter (UFDC-1) working well with any frequency-time domain sensors. approach lets significantly simplify the design process, reduce time-to-market and production and produce . . . → Read More: Practical Circuits and Interface Techniques for MEMS Accelerometers with Quasi-Digital Output Safety systems, such as tire pressure monitors and lane departure warning systems, will be the engine behind continued growth in the automotive electronics market, according to the global research and consulting company Strategy Analytics. Its new report, “Automotive System Demand 2003 to 2012,” forecasts that the global market for automotive electronics will rise from $36 billion . . . → Read More: Safety Systems Drive Automotive Electronics Growth A tutorial CD titled “Interactive Test & Measurement Troubleshooting Guide: How to Avoid Common Measurement Errors†is now available from Keithley. The CD lets users explore the symptoms and causes of common errors associated with low-level signals, such as low voltage, low current, low resistance, high resistance, and voltage from a high resistance source measurement. Users . . . → Read More: Interactive CD Aids Troubleshooting |
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